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Photo-pseudo-metal–oxide–semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials

✍ Scribed by Daanoune, M.; Diab, A.; Sirajeddine, S.; Kaminski-Cachopo, A.; Ionica, I.; Papaioannou, G.; Cristoloveanu, S.

Book ID: 120639005
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 1013 KB
Volume: 113
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.4804064

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