✦ LIBER ✦
Electrical characterization of wafer-bonded Ge(111)-on-insulator substrates using four-point-probe pseudo-metal-oxide-semiconductor field-effect transistor method
✍ Scribed by K. Minami; Y. Nakamura; S. Yamasaka; O. Yoshitake; J. Kikkawa; K. Izunome; A. Sakai
- Book ID
- 113937430
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 440 KB
- Volume
- 520
- Category
- Article
- ISSN
- 0040-6090
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