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Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering

✍ Scribed by Boulle, A; Guinebretière, R; Dauger, A

Book ID: 121311234
Publisher: Institute of Physics
Year: 2005
Tongue: English
Weight: 746 KB
Volume: 38
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/38/21/012

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