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In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

✍ Scribed by Sinsheimer, J.; Callori, S. J.; Ziegler, B.; Bein, B.; Chinta, P. V.; Ashrafi, A.; Headrick, R. L.; Dawber, M.

Book ID: 121802540
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 889 KB
Volume: 103
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4848779

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