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In situ X-ray diffraction study of epitaxial growth of ordered Fe3Si films

✍ Scribed by B. Jenichen; V. M. Kaganer; W. Braun; R. Shayduk; B. Tinkham; J. Herfort

Book ID: 106398000
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 364 KB
Volume: 19
Category: Article
ISSN: 0957-4522
DOI: 10.1007/s10854-007-9530-z

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