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In situ X-ray diffraction study of thin film Ir/Si solid state reactions

โœ Scribed by W. Knaepen; J. Demeulemeester; D. Deduytsche; J.L. Jordan-Sweet; A. Vantomme; R.L. Van Meirhaeghe; C. Detavernier; C. Lavoie

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
694 KB
Volume
87
Category
Article
ISSN
0167-9317

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