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In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

✍ Scribed by Naohiko Kato; Ichiro Konomi; Yoshiki Seno; Tomoyoshi Motohiro

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
278 KB
Volume
244
Category
Article
ISSN
0169-4332

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Crystallization of Zr 41.9 Ti 14.7 Cu 13.1 Ni 10.1 Be 20.2 (number indicate at.%) bulk metallic glasses prepared by shock-wave quenching and waterquenching are investigated by in situ X-ray diffraction under continuous heating conditions. Different phases and different precipitation sequences are fo