✦ LIBER ✦

Phase Shift Corrections for Infrared Interference Measurement of Epitaxial Layer Thickness

✍ Scribed by Schumann, P. A.; Phillips, R. P.; Olshefski, P. J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thickness Measurement of Epitaxial Films

✍ Albert, M. P.; Combs, J. F. 📂 Article 📅 1962 🏛 The Electrochemical Society 🌐 English ⚖ 492 KB

On the Infrared Thickness Measurement of

✍ Severin, P. J. 📂 Article 📅 1970 🏛 The Optical Society 🌐 English ⚖ 798 KB

Instrument for measuring thickness of ep

✍ S. I. Stolyarov; A. G. Efremenko; A. A. Galuzo; S. A. Spektor 📂 Article 📅 1977 🏛 Springer US 🌐 English ⚖ 339 KB

Spectrally resolved white–light phase–sh

✍ Debnath, Sanjit K.; Kothiyal, Mahendra P.; Schmit, Joanna; Hariharan, Parameswar 📂 Article 📅 2006 🏛 Optical Society of America 🌐 English ⚖ 101 KB

In situ temperature measurement by infra

✍ J. C. Sturm; P. V. Schwartz; P. M. Garone 📂 Article 📅 1990 🏛 Springer US 🌐 English ⚖ 342 KB

Simulation of the growth rate and layer

✍ Lai-Juh Chen; Chi-Chao Wan; Chenhsin Lien 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 788 KB