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Performance of organic field effect transistors with high-k gate oxide after application of consecutive bias stress

✍ Scribed by Sunwoo Lee; Changhwan Choi; Kilbock Lee; Joong Hwee Cho; Ki-Young Ko; Jinho Ahn

Book ID: 118501892
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 692 KB
Volume: 521
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.03.078

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