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Organic small molecule field-effect transistors with Cytop™ gate dielectric: Eliminating gate bias stress effects

✍ Scribed by Kalb, W. L.; Mathis, T.; Haas, S.; Stassen, A. F.; Batlogg, B.


Book ID
121298040
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
487 KB
Volume
90
Category
Article
ISSN
0003-6951

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