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Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress

✍ Scribed by S. G. J. Mathijssen; M. Cölle; A. J. G. Mank; M. Kemerink; P. A. Bobbert; D. M. De Leeuw


Book ID
125860908
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
507 KB
Volume
90
Category
Article
ISSN
0003-6951

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