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Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces

✍ Scribed by Ng, Tse Nga; Marohn, John A.; Chabinyc, Michael L.


Book ID
121238250
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
691 KB
Volume
100
Category
Article
ISSN
0021-8979

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