## Abstract Electronic trap states at the interface of the gate insulator and the organic semiconductor play a decisive role for the current–voltage characteristic of organic field effect transistors. In this article two techniques will be introduced which eliminate and generate those trap states o
✦ LIBER ✦
Engineering of the dielectric–semiconductor interface in organic field-effect transistors
✍ Scribed by Sun, Xiangnan; Di, Chong-an; Liu, Yunqi
- Book ID
- 121684070
- Publisher
- Royal Society of Chemistry
- Year
- 2010
- Tongue
- English
- Weight
- 488 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0959-9428
- DOI
- 10.1039/b921449f
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