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Performance and Variability Studies of InGaAs Gate-all-Around Nanowire MOSFETs

✍ Scribed by Conrad, Nathan; Shin, SangHong; Gu, Jiangjiang; Si, Mengwei; Wu, Heng; Masuduzzaman, Muhammad; Alam, Mohammad A.; Ye, Peide D.

No coin nor oath required. For personal study only.

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