Predictive 3-D Modeling of Parasitic Gate Capacitance in Gate-all-Around Cylindrical Silicon Nanowire MOSFETs

✍ Scribed by Jibin Zou; Qiumin Xu; Jieying Luo; Runsheng Wang; Ru Huang; Yangyuan Wang

• Book ID: 114620652
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 901 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2162521