✦ LIBER ✦
Sensitivity of Gate-All-Around Nanowire MOSFETs to Process Variations—A Comparison With Multigate MOSFETs
✍ Scribed by Yu-Sheng Wu; Pin Su
- Book ID
- 114619257
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 604 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9383
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