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Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometry

✍ Scribed by Jimmy D. Moore; Alex Henderson; John S. Fletcher; Nicholas P. Lockyer; John C. Vickerman


Book ID
112206883
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
206 KB
Volume
45
Category
Article
ISSN
0142-2421

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A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values