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Parametric study of temperature distributions in chips joined by controlled chip collapse techniques : S. Oktay, Proc. 1969 Electron. Compon. Conf., Washington D.C., 30 April–2 May (1969), p. 429

Publisher: Elsevier Science
Year: 1969
Tongue: English
Weight: 97 KB
Volume: 8
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(69)90348-5

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