A 10 mm thickness columned CaCu 3 Ti 4 O 12 ceramic was fabricated by the conventional solid-state reaction method and the dielectric properties of different parts in ceramic had been investigated. For the sample close to the surface, only one Debye-type relaxation around 10 7 Hz was observed at roo
Oxygen related defects in germanium
β Scribed by P. Clauws
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 656 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0921-5107
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β¦ Synopsis
Spectroscopic investigations during the last decade have resulted in a detailed picture of oxygen related defects in germanium such as oxygen interstitials and thermal donors. The results are summarized and compared with those of equivalent centres in silicon. The many similarities suggest that unified models for the major oxygen defects in the two semiconductors may apply.
π SIMILAR VOLUMES
Properties of the recently reported deep-level radiation defects in oxygen-rich silicon (the M-center in p-type Si with the DLTS levels at E v ΓΎ 0:36 and E v ΓΎ 0:12 eV, and the X-center in n-type Si with the level at E c Γ 0:11 eV, respectively) are investigated by means of DLTS and IR absorption. W
Hydrogen and Oxygen in Germa