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Oxygen-defects-related dielectric response in CaCu3Ti4O12 ceramics

✍ Scribed by Ying He; Huaiwu Zhang; Peng Liu; Jianping Zhou; Chunhong Mu

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
523 KB
Volume
404
Category
Article
ISSN
0921-4526

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✦ Synopsis

A 10 mm thickness columned CaCu 3 Ti 4 O 12 ceramic was fabricated by the conventional solid-state reaction method and the dielectric properties of different parts in ceramic had been investigated. For the sample close to the surface, only one Debye-type relaxation around 10 7 Hz was observed at room temperature. However, for the sample close to the core, another relaxation peak was observed at about 10 4 Hz. The results were explained in terms of the equivalent circuit model by showing in the impedance spectroscopy. Moreover, it was introduced that the low-frequency dielectric relaxation is associated with the electrode-sample contact effect based on varying sample thickness and an annealing treatment in the nitrogen atmospheres.

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