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Oxide-state evaluation of the zinc and aluminium in metallic thin films using Auger-electron-spectroscopy depth profiles

✍ Scribed by Mandrino, Djordje; Godec, Matjaž; Nolan, David

Book ID: 123317298
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 922 KB
Volume: 98
Category: Article
ISSN: 0042-207X
DOI: 10.1016/j.vacuum.2012.09.019

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