UV photoelectron spectroscopy of thin films and interfaces between 3 and 50 eV and Auger analysis in the same apparatus using multichannel plates and a low energy electron diffraction head

✍ Scribed by M. Priol; J. Peisner; S. Robin

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 34 KB
• Volume: 89
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(82)90317-0