## Recciwd 4 August 197.5 Revised manuscript rcccivcd 29 Scptcmbcr 1975 The XPS spectrum of the 4fIzvels of W in N+\VOJ bronzes is explained by sssurning the prescnca of three oxidation states (WG+, Wsc nnd \V4'). Tetravslcnt tungsten is formed by dismutation of W 5+. The partial reduction of W6+
Oxidation States of Chromium Dissolved in Glass Determined by X-ray Photoelectron Spectroscopy
โ Scribed by R.K. Brow
- Book ID
- 110823660
- Publisher
- John Wiley and Sons
- Year
- 1987
- Tongue
- English
- Weight
- 382 KB
- Volume
- 70
- Category
- Article
- ISSN
- 0002-7820
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๐ SIMILAR VOLUMES
tability of core samples; for a review see Anderson (11). The wettability and stability of silane-treated substrates are cen-Here, however, one of the interests is in understanding the tral in many processes of industrial and environmental interest. mechanism by which a naturally water-wet surface l
## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.