The oxidation state of tungsten in NaxWO3 bronzes as determined by X-ray photoelectron spectroscopy
โ Scribed by B.A. De Angelis; M. Schiavello
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 213 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0009-2614
No coin nor oath required. For personal study only.
โฆ Synopsis
Recciwd 4 August 197.5 Revised manuscript rcccivcd 29 Scptcmbcr 1975
The XPS spectrum of the 4fIzvels of W in N+\VOJ bronzes is explained by sssurning the prescnca of three oxidation states (WG+, Wsc nnd \V4'). Tetravslcnt tungsten is formed by dismutation of W 5+. The partial reduction of W6+ nnd W5' during the recording of XPS spectra is briefly considered.
Tungster~ bro~~zcs hvc been tlw subject ofrnm~y
๐ SIMILAR VOLUMES
## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.
Ionization enerses habe been measured for N3PsC16 by He I photoelectron spectroscopy and they are compared with values caiadated with the overlapping-spheres version of the Xa scattered wave method: the average discrepancy is less than 0.4 eV. The navefunctions and associated charge distributions ar