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Optimization of threshold voltage window under tunneling program/erase in nanocrystal memories

โœ Scribed by Compagnoni, C.M.; Ielmini, D.; Spinelli, A.S.; Lacaita, A.L.


Book ID
114618014
Publisher
IEEE
Year
2005
Tongue
English
Weight
445 KB
Volume
52
Category
Article
ISSN
0018-9383

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