Edge Profile Effect of Tunnel Oxide on Erase Threshold-Voltage Distributions in Flash Memory Cells

✍ Scribed by Bomsoo Kim; Wook-Hyun Kwon; Chang-Ki Baek; Younghwan Son; Chan-Kwang Park; Kinam Kim; Dae M. Kim

• Book ID: 114618503
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 865 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.885101