✦ LIBER ✦

On the origin of the dispersion of erased threshold voltages in flash EEPROM memory cells

✍ Scribed by Essemi, D.; Ricco, B.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Edge Profile Effect of Tunnel Oxide on E

✍ Bomsoo Kim; Wook-Hyun Kwon; Chang-Ki Baek; Younghwan Son; Chan-Kwang Park; Kinam 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 865 KB

Three-dimensional modeling of the erasin

✍ Lorenzini, M.; Vissarion, R.; Rudan, M. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 825 KB

Correction to “Edge Profile Effect of Tu

✍ Bomsoo Kim; Wook-Hyun Kwon; Chang-Ki Baek; Younghwan Son; Chan-Kwang Park; Kinam 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 27 KB

[Widerkehr & Associates 1996 Symposium o

✍ Yoshikawa, K. 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 250 KB

Dependence of the memory and the intensi

✍ A. I. Proskura 📂 Article 📅 1974 🏛 Springer US 🌐 English ⚖ 378 KB

Impact of the interfaces in the charge t

✍ Zhenjie Tang; Xinhua Zhu; Hanni Xu; Yidong Xia; Jiang Yin; Zhiguo Liu; Aidong Li 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 721 KB