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Optimization of demolding temperature for throughput improvement of nanoimprint lithography

✍ Scribed by T. Leveder; S. Landis; L. Davoust; N. Chaix


Book ID
104051624
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
547 KB
Volume
84
Category
Article
ISSN
0167-9317

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