✦ LIBER ✦

Optical near-field characterization of submicron structured silicon films

✍ Scribed by H. Brückl; H. Pagnia; N. Sotnik; Ch. Wilbertz

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Two-dimensional dopant profiling of sili

✍ Mustapha Djebbouri; François Bertin; Naziha Kesri; Ahmad Bsiesy 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 498 KB

Optical characterization of amorphous si

✍ G.D. Cody; C.R. Wronski; B. Abeles; R.B. Stephens; B. Brooks 📂 Article 📅 1980 🏛 Elsevier Science ⚖ 617 KB

Nano-structuring of silicon and porous s

✍ Diesinger, H. ;Bsiesy, A. ;Hérino, R. 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 243 KB

Optical Characterization of Free-Standin

✍ S. Guha; Peter Steiner; F. Kozlowski; W. Lang 📂 Article 📅 1997 🏛 Springer 🌐 English ⚖ 155 KB

Optical characterization of porous silic

✍ V. Torres-Costa; R.J. Martín-Palma; J.M. Martínez-Duart 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 369 KB

Near field measurements of optical chann

✍ Howard E. Jackson; Susan M. Lindsay; C.D. Poweleit; David H. Naghski; Gregory N. 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 266 KB