๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Optical functions of uniaxial ZnO determined by generalized ellipsometry

โœ Scribed by Jellison, G. E.; Boatner, L. A.

Book ID
125425184
Publisher
The American Physical Society
Year
1998
Tongue
English
Weight
92 KB
Volume
58
Category
Article
ISSN
1098-0121

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Determination of Complex Optical Constan
Determination of Complex Optical Constants of Uniaxial HgI2 by Spectroscopic Conventional and Generalized Ellipsometry
โœ En Naciri, A. ;Johann, L. ;Kleim, R. ;Sieskind, M. ;Amann, M. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 233 KB ๐Ÿ‘ 2 views

The conventional ellipsometry can be applied to determine the optical properties of anisotropic materials only if the measurements are made for in-plane uniaxial anisotropy of the bulk sample with the optic axis parallel or perpendicular to the plane of incidence. For arbitrarily oriented anisotropi

Uniaxial anisotropy of organic thin film
Uniaxial anisotropy of organic thin films determined by ellipsometry
โœ Heinemeyer, U. ;Hinderhofer, A. ;Alonso, M. I. ;Ossรณ, J. O. ;Garriga, M. ;Kytka, ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 329 KB

## Abstract Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based o