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Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry

✍ Scribed by C. Bundesmann; N. Ashkenov; M. Schubert; A. Rahm; H.v. Wenckstern; E.M. Kaidashev; M. Lorenz; M. Grundmann


Book ID
113936686
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
155 KB
Volume
455-456
Category
Article
ISSN
0040-6090

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