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Optical characterization of Si[sub 1âx]Ge[sub x] nanodots grown on Si substrates via ultrathin SiO[sub 2] buffer layers

✍ Scribed by Poweleit, C. D.; Hu, C.-W.; Tsong, I. S. T.; Tolle, J.; Kouvetakis, J.

Book ID: 121085310
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 851 KB
Volume: 101
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2743742

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