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Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry

✍ Scribed by Gustin, Kenneth M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Studies on inhomogeneous transparent opt

✍ P. Chindaudom; K. Vedam 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 285 KB

Characterization of inhomogeneous transp

✍ Chindaudom, P. ;Vedam, K. 📂 Article 📅 1994 🏛 The Optical Society 🌐 English ⚖ 911 KB

Determination of the optical constants o

✍ Chindaudom, P.; Vedam, K. 📂 Article 📅 1992 🏛 Optical Society of America 🌐 English ⚖ 432 KB

p-Polarized Reflectances for Transparent

✍ CATALÁN, L. A. 📂 Article 📅 1965 🏛 Optical Society of America ⚖ 363 KB

Spectroscopic ellipsometry with compensa

✍ F. Bertin; A. Chabli; E. Chiariglione; M. Burdin; M. Berger; T. Boudet; O. Larti 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 199 KB

Characterization of Optical Thin Films b

✍ Susan Trolier-McKinstry; Pong Chindaudom; Kuppuswami Vedam; Basavaraj V. Hiremat 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 544 KB