Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials

✍ Scribed by Chindaudom, P. ;Vedam, K.

• Book ID: 115343366
• Publisher: The Optical Society
• Year: 1994
• Tongue: English
• Weight: 911 KB
• Volume: 33
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.33.002664