✦ LIBER ✦

Spectroscopic ellipsometry with compensator and X-ray specular reflectivity for characterization of thin optical layers on transparent substrates

✍ Scribed by F. Bertin; A. Chabli; E. Chiariglione; M. Burdin; M. Berger; T. Boudet; O. Lartigue; G. Ravel

Book ID: 114086284
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 199 KB
Volume: 313-314
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(97)00771-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A New Versatile Instrument for Character

A New Versatile Instrument for Characterization of Thin Films and Multilayers Using Spectroscopic Ellipsometry and Grazing X-Ray Reflectance

✍ Boher, P. ;Stehle, J.L. 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 396 KB 👁 1 views

Thickness Measurements of Thin Perfluoro

Thickness Measurements of Thin Perfluoropolyether Polymer Films on Silicon and Amorphous-Hydrogenated Carbon with X-Ray Reflectivity, ESCA and Optical Ellipsometry

✍ Michael F. Toney; C.Mathew Mate; K.Amanda Leach; Daryl Pocker 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we

CW Laser Operation of KLu0.945Tm0.055(WO

CW Laser Operation of KLu0.945Tm0.055(WO4)2ndash;KLu(WO4)2 Epilayers Near 2 μm Silvestre, O.; Pujol, M.C.; Aguilo, M.; Diaz, F.; Mateos, X.; Petrov, V.; Griebner, U. Quantum Electronics, IEEE Journal of Volume: 43 , Issue: 3 Digital Object Identifier: 10.1109/JQE.2006.890383 Publication Year: 2007 , Page(s): 257 - 260 IEEE Journals & Magazines Quick Abstract | PDF (261 KB) Thin epilayers of monoclinic KLu(WO4)2 doped with thulium are grown by liquid phase epitaxy on undoped KLu(WO4 )2 substrates. The epitaxial composites are optically characterized and implemented in a cavity, longitudinally pumped (normal to the layer) by a Ti:sapphire laser. Tunable (1894-2039 nm) continuous-wave laser operation is achieved with maximum slope efficiency as high as 64% with respect to the absorbed pump power at 802 nm. T

✍ C. Masoller; T. Sorrentino; M. Chevrollier; M. Oria 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 262 KB