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Optical characterization of InAlAs/InGaAs metamorphic high-electron mobility transistor structures with tensile and compressive strain

✍ Scribed by Chan, Ching-Hsiang; Ho, Ching-Hwa; Chen, Ming-Kai; Lin, Yu-Shyan; Huang, Ying-Sheng; Hsu, Wei-Chou

Book ID: 118004200
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 708 KB
Volume: 529
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.03.060

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