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Optical characterization of heavily doped silicon

✍ Scribed by Joachim Wagner


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
389 KB
Volume
30
Category
Article
ISSN
0038-1101

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Growth and characterization of heavily d
✍ R. Scala; M. Porrini; G. Borionetti πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 298 KB πŸ‘ 1 views

## Abstract Silicon crystals grown with the Czochralski method are still the most common material used for the production of electronic devices. In recent years, a growing need of large diameter crystals with increasingly higher doping levels is observed, especially to support the expanding market