Optical characterization of heavily doped silicon : Joachim Wagner. Solid-St. Electron.30, 1117 (1987)

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 137 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90513-1