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Optical characterization of AlxGa1−xN/GaN high electron mobility transistor structures

✍ Scribed by D.Y. Lin; J.D. Wu; J.Y. Zheng; C.F. Lin


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
180 KB
Volume
40
Category
Article
ISSN
1386-9477

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