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Electron mobility characteristics of InxGa1 − xAs/InAlAs/InP high electron mobility transistor (HEMT) structures grown by molecular beam epitaxy

✍ Scribed by Dong-Wan Roh; Hae-Gwon Lee; Jae-Jin Lee


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
339 KB
Volume
167
Category
Article
ISSN
0022-0248

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