✦ LIBER ✦

Opposite-channel-based charge injection in SOI MOSFET's under hot carrier stress

✍ Scribed by Zaleski, A.; Sinha, S.P.; Ioannou, D.E.; Campisi, G.J.; Hughes, H.L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Opposite-channel-based injection of hot-

✍ Ioannou, D.E.; Duan, F.L.; Sinha, S.P.; Zaleski, A. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 182 KB

In-depth analysis of opposite channel ba

✍ S.P. Sinha; A. Zaleski; D.E. Ioannou; G.J. Campisi; H.L. Hughes 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 252 KB

Numerical simulation of avalanche hot-ca

✍ Chen Yu-Zhang; Tang Ting-Wei 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 743 KB

Enhanced hot-carrier-degradation in LDD

✍ Shimoyama, N.; Tsuchiya, T. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 465 KB

Stress induced leakage currents in N-MOS

✍ D Goguenheim; A Bravaix; D Vuillaume; F Mondon; M Jourdain; A Meinertzhagen 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 483 KB

Low frequency noise in short-channel MOS

✍ Jen-Tai Hsu; Xiaoyu Li; C.R. Viswanathan 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 308 KB