In-depth analysis of opposite channel based charge injection in SOI MOSFETs and related defect creation and annihilation

✍ Scribed by S.P. Sinha; A. Zaleski; D.E. Ioannou; G.J. Campisi; H.L. Hughes

• Book ID: 103599434
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 252 KB
• Volume: 28
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(95)00081-i