๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

On the SIMS depth profiling analysis: reduction of matrix effect

โœ Scribed by Y. Gao; Y. Marie; F. Saldi; H.-N. Migeon

Book ID
107920649
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
725 KB
Volume
143
Category
Article
ISSN
0168-1176

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

The effect of orientation on ion beam er
The effect of orientation on ion beam erosion rates in ionic crystals measured by SIMS depth profiling
โœ A. M. C. Kilner; J. A. Kilner; J. C. Elliott; G. Cressey; S. D. Littlewood ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 783 KB

## Abstract There are reports in the literature that crystal orientation is a major source of variation in sputter yields when examining biomineralized tissue material. To examine this further, single crystals of fluorapatite and calcite, both mineralogical analogues, were examined with two differe