𝔖 Bobbio Scriptorium
✦   LIBER   ✦

On the possibility of measuring the thickness of very thin films using electron probe microanalyzer

✍ Scribed by Š. Luby; J. Kubek


Book ID
112570632
Publisher
Springer
Year
1978
Tongue
English
Weight
462 KB
Volume
28
Category
Article
ISSN
0011-4626

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