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On the measurements of lattice parameters of semiconductor thin films

✍ Scribed by B. Dogil; A. J. Horodecki; W. Precht

Publisher: John Wiley and Sons
Year: 1977
Tongue: English
Weight: 110 KB
Volume: 12
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19770121214

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