High-frequency measurements of the magnetoresistance effect of thin films

✍ Scribed by Nobuyuki Yoshizawa; Hiroshi Nakane; Teruo Negishi; Yutaka Shimada

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 465 KB
• Volume: 132
• Category: Article
• ISSN: 0424-7760
• DOI: 10.1002/(sici)1520-6416(20000730)132:2<1::aid-eej1>3.0.co;2-y

✦ Synopsis

The ac magnetoresistance of thin films at frequencies up to 10 kHz was successfully measured. Patterned electrodes with mechanical flexibility were pressed onto the film surface by using a rubber pad. Induction noises were reduced considerably in comparison to the conventional four-electrode method. A seven-electrode system was developed to prevent high-frequency induction noise, typically induced by leakage flux from the sample edges. It was found that the seven-electrode system enables magnetoresistance measurements with little induction noise at frequencies up to 10 kHz.