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On the kinetics of the generation of point defects in the Si-SiO2system

✍ Scribed by D. Kropman,S. Dolgov,T. Karner

Book ID: 118290208
Publisher: Springer
Year: 1996
Tongue: English
Weight: 209 KB
Volume: 62
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf01567119

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