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On the DLTS-characterization of dislocation states in silicon

✍ Scribed by Dr. W. Szkiełko; Dr. O. Breitenstein; Dr. R. Pickenhein

Publisher: John Wiley and Sons
Year: 1981
Tongue: English
Weight: 331 KB
Volume: 16
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19810160213

No coin nor oath required. For personal study only.

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