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On surface plasmons in porous silicon: Measurements of the electron energy loss in etched silicon nanocrystals

✍ Scribed by Sassaki, R. Massami; Galembeck, F.; Teschke, O.


Book ID
120566474
Publisher
American Institute of Physics
Year
1996
Tongue
English
Weight
384 KB
Volume
69
Category
Article
ISSN
0003-6951

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The optical response of n-type porous silicon is investigated using spectroscopic ellipsometry in the energy range of 1.5 -5 eV. The close interrelationship between the microstructure and electronic states is examined on (1 0 0) oriented n-type single crystal silicon wafers anodically etched for di