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OFF-State leakage current mechanisms in bulkSi and SOI MOSFETs and their impact on CMOS ULSIs standby current

โœ Scribed by Adan, A.O.; Higashi, K.


Book ID
114538830
Publisher
IEEE
Year
2001
Tongue
English
Weight
220 KB
Volume
48
Category
Article
ISSN
0018-9383

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